Indium gallium zinc oxide (IGZO)-based displays suffer from instability caused by atomic-scale defects. Now, a new study ...

Probing the dynamics of photoemission Date: June 17, 2021 Source: Ludwig-Maximilians-Universität München Summary: Physicists have used ultrashort laser pulses to probe the dynamics of ...

Delayed time zero in photoemission: New record in time measurement accuracy. ScienceDaily . Retrieved June 3, 2025 from www.sciencedaily.com / releases / 2010 / 06 / 100624144109.htm ...

Through such photoemission images we probe a characteristic elastic strain variation at stepped surfaces, and unveil subtle stress-release effects on clean and covered vicinal surfaces.

The photoemission of electrons from metallic nanoparticles is accompanied by the emission of terahertz radiation (its range in the scale of electromagnetic waves is between light and microwaves), ...

This schematic depicts the time-resolved photoemission electron microscopy instrumentation that allows a Femtosecond Spectroscopy Unit to visualize electron movements. The 800nm pump pulse (red) ...

Photoemission 100 years after Einstein In 1921 Einstein won the Nobel Prize not for his work on relativity, but for solving a puzzle that had baffled scientists since 1887 – the photoelectric ...

Fig. 1 (a) Schematic diagram of ultrafast electron emission from carbon nanotubes. (b) TDDFT calculation results show that a depletion layer barrier can be formed at the tip of the carbon nanotube ...

In contrast to the photoemission process, it is understood that the kinetic energy of the Auger electron is defined by the energy levels of the transitions involved in the Auger process and is ...

Microscopy with momentum – the next-generation photoemission microscopy tool for 2D materials and beyond Sponsored by Scienta Omicron Marten Patt studied physics at RWTH Aachen University, and ...

The three main characterisation techniques of the facility are: NanoESCA II Photoemission Electron Microscope (PEEM), high-resolution X-ray Photoelectron Spectroscopy (XPS) and Spot Profile Analysis ...