Electron Backscattered Diffraction (EBSD) Systems can determine quantitative microstructural data on metals, minerals, semiconductors, ceramics, and most other inorganic crystalline materials.

Oxford Instruments today launches the world's first imaging detector to combine Backscattered Electron and X-ray imaging in a single technique – BEX. Unity enables researchers, scientists, and ...

Backscattered Electron and X-Ray (BEX) imaging is a method for Scanning Electron Microscopy (SEM) which obtains data from both X-Ray sensors, such as silicon drift detector, and Backscattered Electron ...

Cloud-top heights were successfully derived from reflected solar radiation measurements within the oxygen A-band absorption. The accuracy of the estimated cloud-top heights was to within 40 meters ...

One side of marijuana leaf (the bear-claw shaped trichomes aid in identification). General Requirements for Scanning Electron Microscopes in Forensic Investigations By the very nature of the wide ...