Figure 2: Coherence properties of backscattered radiation from a-Si:H thin-film solar cells. a, Spectromicroscopy set-up used to characterize the backscattered light.

Electron Backscattered Diffraction (EBSD) Systems can determine quantitative microstructural data on metals, minerals, semiconductors, ceramics, and most other inorganic crystalline materials.

Backscattered Electron and X-Ray (BEX) imaging is a method for Scanning Electron Microscopy (SEM) which obtains data from both X-Ray sensors, such as silicon drift detector, and Backscattered Electron ...

Light waves travel through most materials at the same speed irrespective of direction, Bahl said. "But, by using some direction-sensitive opto-mechanical interactions, we can break that symmetry and ...

Oxford Instruments today launches the world's first imaging detector to combine Backscattered Electron and X-ray imaging in a single technique – BEX. Unity enables researchers, scientists, and ...