那么如何解决这种问题？ 我们使用一种方法为芯片添加测试功能，叫可测性设计design for testability，DFT并不影响芯片的正常工作。 简而言之，可测性设计是一种通过向芯片添加更多电路来使芯片测试变得可行且具有成本效益的设计。

Design for Testability (DFT) is comprised of two very important terms. "Testability" is a condition of a circuit that makes it possible, easy, and cost-effective to test and diagnose the circuit (unit ...

And other testability improvement s” on code testability at Agile Testing Days 2021. The conference will be held November 15-18 in Potsdam, Germany.

The emergence of SoC has been described as a development that will require fundamental changes in the approaches to design-for -testability (DFT). This will take the form of a "test re-use" strategy ...

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Ludovic Henry explains how RISC-V's open ...

One thing I try to make myself consider when designing a PCB, particularly during layout, is what features I can put in for testing – both for bench testing in R&D as well as during manufacturing test ...

Another fundamental rule of signal integrity in high-speed design is ensuring that the transmission line is properly terminated. Many high-speed systems today employ 50-ohm termination. If your device ...